| 摘要 |
PROBLEM TO BE SOLVED: To enable individual test heads to output different addresses. SOLUTION: This IC tester is configured so as to carry out testing on test objects by mounting them on at least two or more test heads. In this case, this device is provided with an address generator AG generating addresses and address scramble memory XM1, XM2, YM1, YM2 which are arranged at least for each of the test heads TH1, TH2 and converts the addresses generated from the address generator AG to output them to the test objects mounted on the test heads.
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