发明名称 DEVELOPMENT PROCESSING METHOD AND DEVELOPMENT PROCESSING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a development processing method which is capable of suppressing the generation of a hardly insolubilized layer of resist at the time of rinsing after shaking off a developer and a development processing device therefor. SOLUTION: At the time of development of exposure patterns after exposure of a resist film formed on a substrate W to prescribed patterns, the developer is applied on the resist film after the exposure of the substrate W and the development is progressed by holding the applied developer still to effect the development processing, following which a rinsing liquid is supplied onto the substrate W to rinse the substrate. The developer from a developer discharge nozzle 123 and the rinsing liquid from a rinsing liquid discharge nozzle 122 are supplied onto the substrate W to rinse the substrate in the initial stage of the rinsing.
申请公布号 JP2001005191(A) 申请公布日期 2001.01.12
申请号 JP19990173781 申请日期 1999.06.21
申请人 TOKYO ELECTRON LTD 发明人 AOYAMA TORU;OMORI TSUTAE
分类号 H01L21/027;G03F7/30;G03F7/32;(IPC1-7):G03F7/30 主分类号 H01L21/027
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