发明名称 |
METHOD FOR FORMING ELECTROSTATIC THERMAL JUNCTION OF SEMICONDUCTOR SUBSTRATE |
摘要 |
PURPOSE: A electrostatic thermal junction formation method of a semiconductor substrate is provided to short a junction process time and reduce a cost of a products by deposing a mixed compound of a metal oxide and a silicon oxide on the substrate to use as an intermediate layer for connecting both of semiconductor substrates. CONSTITUTION: A semiconductor substrate is cleaned by a cleaning process. A mixed compound of a metal oxide and a silicon oxide is deposited on the cleaned substrate. A substrate having the mixed compound is cleaned. The substrate having the mixed compound is applied by a temperature of 10-500 °C and a general semiconductor substrate is applied by a voltage of 10-400 V and both substrate is connected. Acetone, methanol, or deionized water are used for the cleaning process. The deposition process of the mixed compounds of the metal oxide and a silicon oxide is performed by using an electron beam deposition method.
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申请公布号 |
KR100286252(B1) |
申请公布日期 |
2001.01.11 |
申请号 |
KR19970046678 |
申请日期 |
1997.09.11 |
申请人 |
KOREA INSTITUTE OF SCIENCE AND TECHNOLOGY |
发明人 |
CHOI, U BEOM;JU, BYEONG GWON;JUNG, JI WON;OH, MYEONG HWAN |
分类号 |
H01L21/00;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/00 |
代理机构 |
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地址 |
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