首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Reihenanalyse-Verfahren der Genexpression
摘要
申请公布号
DE761822(T1)
申请公布日期
2001.01.11
申请号
DE19960306634T
申请日期
1996.09.12
申请人
THE JOHNS HOPKINS UNIVERSITY SCHOOL OF MEDICINE, BALTIMORE
发明人
KINZLER, KENNETH W.;VELCULESCU, VICTOR E.;VOGELSTEIN, BERT;ZHANG, LIN
分类号
C12N15/09;C12M1/00;C12N15/10;C12Q1/68;C40B40/02;C40B50/06;G06F17/30;(IPC1-7):C12Q1/68
主分类号
C12N15/09
代理机构
代理人
主权项
地址
您可能感兴趣的专利
GUIDING DEVICE FOR CARRIER TAPE
STORAGE MONITORING DEVICE
INFORMATION TRANSMITTING DEVICE
DEVICE FOR OBTAINING ESTIMATION OF MATHEMATICAL EXPECTATION
DEVICE FOR PROGRAMME-CONTROL OF PRODUCTION MACHINES
ELECTROMAGNETIC WELL-LOGGING PROBE
METHOD OF DETERMINING INCLINATION ANGLE OF THE CONTACT SURFACE OF MAGNETIZED BODIES
DEVICE FOR PROCESSING SIGNALS OF DOPPLER SPEED METER
RESISTOR STRAIN-GAUGE TRANSDUCER
FLOW RATE MEASURING DEVICE
EDDY-CURRENT TRANSDUCER
DEVICE FOR TESTING POLAROGRAPHIC INSTRUMENTS
METHOD OF PREPARATIVE DISK-ELECTROPHORESIS
METHOD OF COMPARING TWO HARMONIC SIGNALS OF EQUAL FREQUENCY BY AMPLITUDE
SPECIMEN FOR TENSILE TESTING
METHOD OF MEASURING KNIFE SHARPNESS OF CUTTING TOOL
DEVICE FOR CONTACT-FREE MEASURING OF LATERAL DIMENSIONS OF FILAMENT-LIKE ARTICLES
SENSOR FOR MEASURING ANGLE OF FLARE OF CRACKS IN ARTICLES
METHOD OF MEASURING THE THICKNESS OF SEMICONTOR MATERIAL LAYERS
DISPLACEMENT TRANSDUCER