发明名称 Process for the production of semiconductor substrate having silicon-on-insulating structure and process for the production of semiconductor device
摘要 A process for the production of a semiconductor substrate having a silicon-on-insulator structure comprising the steps of; (A) ion-implanting a semiconductor substrate to form a buried polishing-stop layer inside the semiconductor substrate, (B) patterning a portion of the semiconductor substrate above the buried polishing-stop layer to form a trench portion which reaches the buried polishing-stop layer, thereby forming a semiconductor layer on the buried polishing-stop layer, (C) forming an insulating layer on the semiconductor layer and the buried polishing-stop layer, (D) bonding the semiconductor substrate and a supporting substrate to each other through the insulating layer, (E) grinding and polishing the semiconductor substrate from its rear surface to expose the buried polishing-stop layer, and (F) removing the buried polishing-stop layer to expose the semiconductor layer, in which the semiconductor layer has a thickness of 2x10-8 m to 1x10-7 m and the buried polishing-stop layer has a thickness of 2x10-9 m to 1x10-8 m.
申请公布号 US6169000(B1) 申请公布日期 2001.01.02
申请号 US19990401195 申请日期 1999.09.23
申请人 SONY CORPORATION 发明人 OHKUBO YASUNORI
分类号 H01L21/02;H01L21/304;H01L21/76;H01L21/762;H01L21/84;H01L27/12;(IPC1-7):H01L21/336 主分类号 H01L21/02
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