Integrated circuit testing assembly and method,申请号US08/867379-传众专利搜索

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发明名称	Integrated circuit testing assembly and method
摘要
申请公布号	US6169411(A)	申请公布日期	2001.01.02
申请号	US08/867379	申请日期	1997.06.02
申请人		发明人
分类号		主分类号
代理机构		代理人
主权项
地址

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