发明名称 APPARATUS FOR MEASURING ELECTROMAGNETIC CHARACTERISTICS OF A VERY HIGH TEMPERATURE MATERIAL
摘要 The apparatus comprises a waveguide having one end with an outside rim in the form of a test flange having a plane front surface defining a calibration plane and intended to be applied against a plane surface of a sample of material to be tested, a generator coupled to the waveguide to inject microwaves therein, and means for detecting the waves reflected by the material. At least the terminal portion of the waveguide including the test flange for application against the material to be tested at very high temperature is made of an electrically conductive refractory composite material, such as a carbon/carbon or a carbon/ceramic composite material.
申请公布号 CA2017262(C) 申请公布日期 2000.12.12
申请号 CA19902017262 申请日期 1990.05.22
申请人 发明人 ASTIER, JEAN-PIERRE
分类号 G01N22/00;(IPC1-7):G01N22/00 主分类号 G01N22/00
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