METHOD FOR EVALUATING A SEMICONDUCTOR DEVICE,申请号KR19970015465-传众专利搜索

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发明名称	METHOD FOR EVALUATING A SEMICONDUCTOR DEVICE
摘要
申请公布号	KR100269440(B1)	申请公布日期	2000.12.01
申请号	KR19970015465	申请日期	1997.04.24
申请人	MITSUBISHI DENKI KABUSHIKI KAISHA	发明人	MAETA, HITOSI
分类号	H01L21/66;(IPC1-7):H01L21/66	主分类号	H01L21/66
代理机构		代理人
主权项
地址

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