发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: A semiconductor device is provided to improve reliability and integration of the device, by forming an epitaxial layer on an impurity region so that contact margin is increased. CONSTITUTION: A gate insulating layer(33) and a gate electrode(34) are sequentially formed on a substrate(31). The first insulating layer surrounding the gate electrode is formed. An impurity region(38) is formed in the surface of the substrate on both sides of the gate electrode. The first conductive layer of a predetermined thickness is formed on the impurity region. The second insulating layer having a contact hole to which the first conductive layer is exposed, is formed on the entire surface of the resultant structure. The second conductive layer is connected to the impurity region through the first conductive layer after the contact hole is buried.
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申请公布号 |
KR100268890(B1) |
申请公布日期 |
2000.12.01 |
申请号 |
KR19970066247 |
申请日期 |
1997.12.05 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
CHUN, SUG BO |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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