发明名称 A METHOD OF FABRICATING SEMICONDUCTOR
摘要 PURPOSE: A method for manufacturing a semiconductor device is provided to maintain the size of a contact and to prevent deposition of particles, by forming a uniform silicide layer in a heat treatment process. CONSTITUTION: The first metal layer(23) is deposited on the surface of a semiconductor substrate(21) having a native oxide layer in a state that a predetermined bias voltage is applied to the semiconductor substrate while the native oxide layer is dissociated. The second metal layer(25) of a predetermined thickness is formed on the first metal layer. A heat treatment is performed regarding the semiconductor substrate to form a silicide layer on an interface between the semiconductor substrate and the first metal layer.
申请公布号 KR100271799(B1) 申请公布日期 2000.12.01
申请号 KR19980014742 申请日期 1998.04.24
申请人 HYUNDAI MICRO ELECTRONICS CO., LTD. 发明人 LEE, YOUNG JUN
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
代理机构 代理人
主权项
地址