发明名称 |
A METHOD OF FABRICATING SEMICONDUCTOR |
摘要 |
PURPOSE: A method for manufacturing a semiconductor device is provided to maintain the size of a contact and to prevent deposition of particles, by forming a uniform silicide layer in a heat treatment process. CONSTITUTION: The first metal layer(23) is deposited on the surface of a semiconductor substrate(21) having a native oxide layer in a state that a predetermined bias voltage is applied to the semiconductor substrate while the native oxide layer is dissociated. The second metal layer(25) of a predetermined thickness is formed on the first metal layer. A heat treatment is performed regarding the semiconductor substrate to form a silicide layer on an interface between the semiconductor substrate and the first metal layer.
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申请公布号 |
KR100271799(B1) |
申请公布日期 |
2000.12.01 |
申请号 |
KR19980014742 |
申请日期 |
1998.04.24 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO., LTD. |
发明人 |
LEE, YOUNG JUN |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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