发明名称 METHOD OF DESIGNING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To eliminate timing errors by changing the dimensions of a predetermined cell-forming element within a cell block where an input signal timing error has occurred for timing adjustment after an automatic layout step. SOLUTION: After a circuit design step 1, a temporary interconnection simulation step 2, and a layout design step 3 have been executed, timing detection is performed in an actual interconnection simulation step 4 based on the information gathered during the steps 1, 2, and 3. Then, if a timing error occurres in the following determination step 5, a gate layer of a cell suffering the timing error is selected in a timing adjustment step 7 to extract the length L of a transistor suitable for proper circuit signal timing. Thereafter, in a layout process 8, layout coordinates of a cell for which the L length is to be made variable in an EB processing 6 are extracted. After correcting the L length of the transistor in the process 6, layout data from which the timing error has been eliminated are extracted.
申请公布号 JP2000332119(A) 申请公布日期 2000.11.30
申请号 JP19990143993 申请日期 1999.05.24
申请人 NEC IC MICROCOMPUT SYST LTD 发明人 TATSUMI HIROTOMO
分类号 H01L21/82;G06F17/50;(IPC1-7):H01L21/82 主分类号 H01L21/82
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