发明名称 Memory cell incorporating a chalcogenide element
摘要 A memory cell incorporating a chalcogenide element and a method of making same is disclosed. In the method, a doped silicon substrate is provided with two or more polysilicon plugs to form an array of diode memory cells. A layer of silicon nitride is disposed over the plugs. Using a poly-spacer process, small pores are formed in the silicon nitride to expose a portion of the polysilicon plugs. A chalcogenide material is disposed in the pores by depositing a layer of chalcogenide material on the silicon nitride layer and planarizing the chalcogenide layer to the silicon nitride layer using CMP. A layer of TiN is next deposited over the plugs, followed by a metallization layer. The TiN and metallization layers are then masked and etched to define memory cell areas.
申请公布号 US6153890(A) 申请公布日期 2000.11.28
申请号 US19990374378 申请日期 1999.08.13
申请人 MICRON TECHNOLOGY, INC. 发明人 WOLSTENHOLME, GRAHAM R.;GONZALEZ, FERNANDO;ZAHORIK, RUSSELL C.
分类号 H01L21/285;H01L21/768;H01L21/8229;H01L27/102;H01L27/24;(IPC1-7):H01L47/00 主分类号 H01L21/285
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