| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit device for quickly executing the test of an incorporated memory circuit without reading data to the outside part. SOLUTION: An incorporated memory circuit is provided with plural memory cell blocks 55. Each memory cell block 55 includes a memory cell array having storage elements arranged like a matrix, a self-test control circuit for instructing the reading of storage data stored in the memory cell array at the time of operating the test of a memory, a circulating redundancy inspecting circuit for executing circular redundancy inspection by inputting time-sequential data continuously read from the memory cell array, and an expected value comparing circuit 79 for comparing the circulating redundancy inspected result with the expected value, and for outputting decided data. The memory test operation is executed in parallel in each memory cell block. Then, the judged result of each memory cell block is integrated, and the normality of the incorporated memory circuit is judged. |
