发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE AND MEMORY CELL
摘要 PROBLEM TO BE SOLVED: To obtain a method of manufacturing in which the source/drain region of an FET and a capacitor lower electrode are connected in small resistance without diffusion barrier in a memory cell provided with a stacked capacitor on a MOS field effect transistor (MOSFET). SOLUTION: A polysilicon plug 12 passing through a silicon oxide layer 14 on a silicon chip and connected in correspondence with a source/drain region of an FET is formed and a platinum layer is etched with a dielectric layer 16 as stopper to form a conductor 20. Then a high-dielectric layer 22, a capacitor upper electrode 24 and a dielectric layer 25 such as TEOS are layered, etching is carried out up to the polysilicon plug 12 leaving platinum conductors 20 to form an opening 32, a liner film 28 is formed, a conductive contact 30 is formed being insulated from the upper electrode 24, and the upper part is filled with TEOS 32 or the like.
申请公布号 JP2000323685(A) 申请公布日期 2000.11.24
申请号 JP20000087033 申请日期 2000.03.27
申请人 INFINEON TECHNOL NORTH AMERICA CORP 发明人 LIAN JENNY;GERHARD KUNKEL
分类号 H01L27/105;H01L21/02;H01L21/768;H01L21/8242;H01L21/8246;(IPC1-7):H01L27/108;H01L21/824;H01L27/10 主分类号 H01L27/105
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