发明名称 |
MANUFACTURE OF SEMICONDUCTOR DEVICE AND MEMORY CELL |
摘要 |
PROBLEM TO BE SOLVED: To obtain a method of manufacturing in which the source/drain region of an FET and a capacitor lower electrode are connected in small resistance without diffusion barrier in a memory cell provided with a stacked capacitor on a MOS field effect transistor (MOSFET). SOLUTION: A polysilicon plug 12 passing through a silicon oxide layer 14 on a silicon chip and connected in correspondence with a source/drain region of an FET is formed and a platinum layer is etched with a dielectric layer 16 as stopper to form a conductor 20. Then a high-dielectric layer 22, a capacitor upper electrode 24 and a dielectric layer 25 such as TEOS are layered, etching is carried out up to the polysilicon plug 12 leaving platinum conductors 20 to form an opening 32, a liner film 28 is formed, a conductive contact 30 is formed being insulated from the upper electrode 24, and the upper part is filled with TEOS 32 or the like.
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申请公布号 |
JP2000323685(A) |
申请公布日期 |
2000.11.24 |
申请号 |
JP20000087033 |
申请日期 |
2000.03.27 |
申请人 |
INFINEON TECHNOL NORTH AMERICA CORP |
发明人 |
LIAN JENNY;GERHARD KUNKEL |
分类号 |
H01L27/105;H01L21/02;H01L21/768;H01L21/8242;H01L21/8246;(IPC1-7):H01L27/108;H01L21/824;H01L27/10 |
主分类号 |
H01L27/105 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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