发明名称 TUNGSTEN-FILLED DEEP TRENCHES
摘要 A satisfactory conductive fill of a vertical trench of aspect ratio of at least 20 to 1 in a silicon substrate is obtained by heating the substrate to a temperature of about 375 DEG C or less in a chamber for chemical vapor deposition along with a mixture of WF6, H2, and SiH4 for filling the trench with tungsten. Also, W(CO)6 may be substituted for the WF6.
申请公布号 WO0070673(A1) 申请公布日期 2000.11.23
申请号 WO2000US10075 申请日期 2000.04.14
申请人 INFINEON TECHNOLOGIES NORTH AMERICA CORP. 发明人 HOINKIS, MARC, D.
分类号 C23C16/04;C23C16/14;C23C16/16;H01L21/28;H01L21/285;H01L21/768;H01L21/8242;H01L27/108;(IPC1-7):H01L21/768;H01L21/334;H01L21/824 主分类号 C23C16/04
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