发明名称 Process for building in slits in silicon wafers comprises producing hole structures longitudinal to the slits by pore etching, and connecting the hole structures to the slits by chemical etching
摘要 Process for building in slits in silicon wafers comprises initially producing narrow neighboring hole structures longitudinal to the slits by pore etching, and subsequently connecting the hole structures to the slits by chemical etching. Preferred Features: The hole structures are produced by electrochemical pore etching. The hole structures are connected to the slits by slow chemical etching. The process uses slow alkaline etching by means of a 2% KOH etch at room temperature for 100 about hours.
申请公布号 DE19922257(A1) 申请公布日期 2000.11.16
申请号 DE19991022257 申请日期 1999.05.14
申请人 SIEMENS AG 发明人 LEHMANN, VOLKER;ROENNEBECK, SILKE
分类号 C30B33/00;C30B33/08;H01L21/306;(IPC1-7):C23F1/04 主分类号 C30B33/00
代理机构 代理人
主权项
地址