发明名称 Halbleiterspeichergerät mit einer Prüfschaltung
摘要 A semiconductor memory device is disclosed which has a data output circuit including a first node, a second node, first and second transistors connected in series between the first node and a potential line, third and fourth transistors connected in series between the first node and the potential line, fifth and sixth transistors connected in series between the second node and the potential line, seventh and eighth transistors connected in series between the second node and the potential line, one of the first and third transistors being driven in response to a data signal read from a selected memory cell and one of the fifth and seventh transistors being driven in response to an inverted data signal of the data signal in a normal mode while turning one of the second and fourth transistor and one of the sixth and eighth transistors ON, both of the first and third transistors being driven in response to the data signal and both of the fifth and seventh transistors being driven in response to the inverted data signal while all the second, fourth, sixth and eighth transistors ON. The output circuit further includes an output logic circuit driving an output terminal to one of first and second logic levels when the first and second nods have logic levels different from each other and to a high impedance when the first and second nodes have logic levels equal to each other. <IMAGE>
申请公布号 DE69426087(D1) 申请公布日期 2000.11.16
申请号 DE1994626087 申请日期 1994.01.24
申请人 NEC CORP., TOKIO/TOKYO 发明人 MATSUI, YOSHINORI
分类号 G11C29/00;G11C29/26;G11C29/28;G11C29/34;G11C29/38;(IPC1-7):G11C29/00 主分类号 G11C29/00
代理机构 代理人
主权项
地址