发明名称 METHOD FOR MANUFACTURING METAL INTERCONNECTION OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a metal interconnection of a semiconductor device is provided to improve a characteristic of an interconnection by forming the metal interconnection not by an evaporation method but by a coating method to control a generation of a foreign substance. CONSTITUTION: A wafer(11) is mounted in a rotation unit including a cooling pipe(15) established in a chamber(17). The rotation unit is rotated after aluminum of a liquid state is placed on the wafer, so that the aluminum of a liquid stage is uniformly applied on the wafer. The liquid state aluminum uniformly applied on the entire surface of the wafer is cooled down to form a solid aluminum thin film. The solid aluminum thin film is patterned to form a metal interconnection.
申请公布号 KR20000065841(A) 申请公布日期 2000.11.15
申请号 KR19990012547 申请日期 1999.04.09
申请人 HYUNDAI MICRO ELECTRONICS CO.,LTD. 发明人 RYU, JE GANG
分类号 H01L21/28;(IPC1-7):H01L21/28 主分类号 H01L21/28
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