发明名称 |
METHOD FOR MANUFACTURING METAL INTERCONNECTION OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a metal interconnection of a semiconductor device is provided to improve a characteristic of an interconnection by forming the metal interconnection not by an evaporation method but by a coating method to control a generation of a foreign substance. CONSTITUTION: A wafer(11) is mounted in a rotation unit including a cooling pipe(15) established in a chamber(17). The rotation unit is rotated after aluminum of a liquid state is placed on the wafer, so that the aluminum of a liquid stage is uniformly applied on the wafer. The liquid state aluminum uniformly applied on the entire surface of the wafer is cooled down to form a solid aluminum thin film. The solid aluminum thin film is patterned to form a metal interconnection.
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申请公布号 |
KR20000065841(A) |
申请公布日期 |
2000.11.15 |
申请号 |
KR19990012547 |
申请日期 |
1999.04.09 |
申请人 |
HYUNDAI MICRO ELECTRONICS CO.,LTD. |
发明人 |
RYU, JE GANG |
分类号 |
H01L21/28;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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地址 |
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