发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To readily form in a short time a shallow P-type semiconductor region, having relatively high impurity concentration and a deep P-type semiconductor region which has a relatively low impurity concentration. SOLUTION: A silicon oxide film 2 is formed on a silicon semiconductor base body 1. A liquefied impurity source 3, composed of a mixture of aluminum, boron, and an organic solvent, is coated on the silicon oxide film 2, and this is heated at temperatures lower than the diffusion temperatures of aluminum, and the organic solvent is evaporated to form a layer containing aluminum and boron. This layer is heated in the atmosphere containing oxygen. Thereafter, it is heated at temperatures higher than the thermal processing temperatures, and aluminum and boron are diffused in an N-type semiconductor substrate 1 to form first and second P-type semiconductor regions 9, 10 having different impurity concentrations.
申请公布号 JP2000315660(A) 申请公布日期 2000.11.14
申请号 JP19990121611 申请日期 1999.04.28
申请人 SANKEN ELECTRIC CO LTD 发明人 SUGIYAMA KINJI;TANAKA YASUO;YAJIMA HIROSHI
分类号 H01L21/225;(IPC1-7):H01L21/225 主分类号 H01L21/225
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