发明名称 TEST DEVICE FOR IMAGE PICKUP ELEMENT
摘要 PROBLEM TO BE SOLVED: To detect a very weak ripple component included in an image signal from an image pickup signal having a blanking signal and the image signal with a large level difference. SOLUTION: The image pickup element test device 40 that extracts an image signal component from an image pickup signal including a blanking signal and the image signal outputted from an image pickup element 10 and discriminates whether or not a ripple component is present in the image signal component to decide the quality of the image pickup element 10, generates a bias voltage in a signal path for a period of the blanking signal or a period of the image signal, adds this bias voltage to the blanking signal or the image signal, applies compression processing to amplitude of the image pickup signal and amplifies the image pickup signal subjected to the compression processing so as to decide the presence/absence of a ripple component in the image signal component.
申请公布号 JP2000312369(A) 申请公布日期 2000.11.07
申请号 JP19990119019 申请日期 1999.04.27
申请人 ADVANTEST CORP 发明人 HAYASHI MASAKI
分类号 H01L27/14;G01R31/26;H04N5/372;H04N17/00;(IPC1-7):H04N17/00;H04N5/335 主分类号 H01L27/14
代理机构 代理人
主权项
地址