发明名称 Ball grid array probing technique
摘要 A printed circuit assembly includes a printed circuit board with an electrically conductive via formed therein that extends from the front side of the printed circuit board to the back side of the printed circuit board. A ball grid array package mounted to the front side of the printed circuit board is electrically connected to the electrically conductive via. A probe pad formed on the back side of the printed circuit board is laterally displaced from the electrically conductive via and is electrically connected thereto. A solder mask layer deposited on the back side of the printed circuit board includes a probe pad aperture formed therein that is substantially aligned with the probe pad so that the probe pad is exposed by the probe pad aperture formed in the solder mask layer.
申请公布号 US6144213(A) 申请公布日期 2000.11.07
申请号 US19980072952 申请日期 1998.05.05
申请人 AGILENT TECHNOLOGIES 发明人 JOHNSON, KENNETH W.
分类号 H05K3/00;G01R31/28;H05K1/02;(IPC1-7):G01R1/02;H01R12/32;H05K1/11 主分类号 H05K3/00
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