发明名称 Semiconductor memory having an improved reading circuit
摘要 A DRAM comprises a first DRAM cell and a second DRAM cell connected to a first bit line and a second bit line, respectively, which constitute a pair of bit lines precharged to a reference potential and which are connected to a sense amplifier for comparing data stored in a memory cell selected from the first and second memory cells with a reference potential, so as to output the result of comparison as a read-out data. When a selected memory cell of the first and second memory cells is read out, a reference potential setting circuit sets the bit line associated to a non-selected memory of the first and second memory cells, to the reference potential at least one time during a period after the one of the first and second memory cells is selected to be read out and before the sense amplifier is activated.
申请公布号 US6144601(A) 申请公布日期 2000.11.07
申请号 US19990354599 申请日期 1999.07.16
申请人 NEC CORPORATION 发明人 TAKEDA, KOICHI
分类号 G11C11/409;G11C7/06;G11C7/14;G11C11/4091;G11C11/4099;(IPC1-7):G11C7/00 主分类号 G11C11/409
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