发明名称 SCANNING MICROSCOPE
摘要 <p>PROBLEM TO BE SOLVED: To correct the orthogonality, distortion and aspect ratio of an image precisely and easily in response to a plurality of accelerating voltages and WD by inputting calculation results on rotation angle setting correction and other corrections into a plurality of four-quadrant multiplication DACs, and making these corrections with the multiplication DACs. SOLUTION: Sweep signals Xo(t), Yo(t) generated from a scanning signal generating circuit are inputted to multiplication DACs: DX, DY, and magnifying power, accelerating voltage interlock, and distance (WD) interlock between an objective lens top face and a sample are set, then part of them is inputted to four-quadrant multiplication DACs: DX-1X, DY-1X, DX-1Y, DY-1Y controlling upper scanning coils 1X, 1Y, and the other part is inputted to four-quadrant multiplication DACs: DX-2X, DY-2X, DX-2Y, DY-2Y controlling lower scanning coils 2X, 2Y. Rotation angle setting, orthogonality correction and aspect ratio correction are made, then desired scanning currents are fed to scanning coils.</p>
申请公布号 JP2000311644(A) 申请公布日期 2000.11.07
申请号 JP20000045975 申请日期 2000.02.23
申请人 SEIKO INSTRUMENTS INC 发明人 MARUO MASAYUKI;KITAMURA TADASHI;MORITA SEIJI;OI MASAMICHI;YONEZAWA AKIRA
分类号 H01J37/147;G01N23/225;G01Q10/06;G01Q30/04;H01J37/28;(IPC1-7):H01J37/147 主分类号 H01J37/147
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