发明名称 Apparatus and method for simultaneously determining thermal conductivity and thermal contact resistance
摘要 An apparatus and method for simultaneously determining thermal conductivity and thermal contact resistance of a sample which employs an transient method of taking data for use in such determinations, and an inverse method of determining the values using a methodology set forth herein. As a result, the present invention permits a more accurate, and economically efficient determination of thermal conductivity and thermal contact resistance than methods presently used.
申请公布号 US6142662(A) 申请公布日期 2000.11.07
申请号 US19980098630 申请日期 1998.06.16
申请人 NEW JERSEY INSTITUTE OF TECHNOLOGY 发明人 NARH, KWABENA A.;SRIDHAR, L.
分类号 G01N25/18;(IPC1-7):G01N25/18;G01N25/00;G01N25/20 主分类号 G01N25/18
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