发明名称 |
Apparatus and method for simultaneously determining thermal conductivity and thermal contact resistance |
摘要 |
An apparatus and method for simultaneously determining thermal conductivity and thermal contact resistance of a sample which employs an transient method of taking data for use in such determinations, and an inverse method of determining the values using a methodology set forth herein. As a result, the present invention permits a more accurate, and economically efficient determination of thermal conductivity and thermal contact resistance than methods presently used.
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申请公布号 |
US6142662(A) |
申请公布日期 |
2000.11.07 |
申请号 |
US19980098630 |
申请日期 |
1998.06.16 |
申请人 |
NEW JERSEY INSTITUTE OF TECHNOLOGY |
发明人 |
NARH, KWABENA A.;SRIDHAR, L. |
分类号 |
G01N25/18;(IPC1-7):G01N25/18;G01N25/00;G01N25/20 |
主分类号 |
G01N25/18 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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