发明名称 Method of growing gate oxides
摘要 A method for manufacturing a gate oxide film in a semiconductor device includes: preparing a semiconductor substrate having a first and a second active region; implanting germanium ions into the first active region; and forming a first and a second gate oxide films on the first and the second active regions, respectively, wherein the first gate oxide film is thicker than the second gate oxide film.
申请公布号 US6143669(A) 申请公布日期 2000.11.07
申请号 US19980192498 申请日期 1998.11.17
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 CHO, WON JU
分类号 H01L29/78;H01L21/8234;H01L27/088;(IPC1-7):H01L21/31 主分类号 H01L29/78
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