发明名称 WITHSTAND VOLTAGE PROPERTY INSPECTION DEVICE FOR ANALOGUE CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a withstand voltage property inspection device for an analogue circuit capable of inspecting withstand voltage property of a plurality of inspection elements of a circuit to be inspected without omitting any inspections with high accuracy in a short period. SOLUTION: Unit relay elements 1a-1f are inserted between electrodes of a searching transistor 25n, and the variation of currents of the electrodes are analyzed by the unit relay elements short circuited correspondingly to withstand voltage power supplies 2a-2f with a variation out of the tolerance range of at least one of terminal power supplies 5C, 5B, 5E. Operating state data are compared with withstand voltage reference data for detecting a unit relay meeting the withstand degradation condition to display the transistor 25n by flickering, a terminal whose voltage has changed in the terminal power supplies 5C, 5B, 5E is displayed in red, a connection line between transistors 25n identifiably displays flow-in and flow-out of current to the transistors 25n in yellow and purple respectively, and withstand voltage inspections of many transistors are automatically carried out with high accuracy in a short period, then transistors whose withstand voltage property degraded are displayed identifiably by an indicator 17 to clearly judge degradation conditions of the withstanding voltage property by the colors.
申请公布号 JP2000304828(A) 申请公布日期 2000.11.02
申请号 JP19990114862 申请日期 1999.04.22
申请人 SONY CORP 发明人 MURAOKA YASUNARI
分类号 G01R31/26;G01R31/30;G01R31/316;(IPC1-7):G01R31/316 主分类号 G01R31/26
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