发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To form an N+-type layer which becomes the emitter contact of a bipolar transistor at a low temperature. SOLUTION: An N--type epitaxial layer 2 is grown on an N-type silicon substrate 1, and a silicon dioxide film 3 is formed, after which a P-type MBE layer 4 and a P--type MBE layer 5 are grown. Next, after forming a silicon dioxide film 6 and a CVD silicon nitride film 8, an emitter is opened with a photoresist 9 as a mask. Next, in an MBE device, antimony-doped amorphous silicon is deposited at a room temperature, which is thereafter subjected to a solid-phase growing step under a heat treatment at 730 deg.C to form an N+-type layer 10 having an epitaxial/polysilicon interface, which is then patterned to form an emitter contact.
申请公布号 JP2000306921(A) 申请公布日期 2000.11.02
申请号 JP20000074517 申请日期 2000.03.16
申请人 NEC CORP 发明人 TAKANO HIROSHI
分类号 H01L29/73;H01L21/203;H01L21/331;(IPC1-7):H01L21/331 主分类号 H01L29/73
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