| 摘要 |
<p>In order to prevent an increase of the circuit area of a semiconductor integrated circuit for testing a logical circuit, circuit data on the semiconductor integrated circuit are collected, the probability of occurence of transition signal of a storage device with a scanning function is calculated, a storage device with a scanning function which can be changed to a storage device with a scanning function for delay test is selected according to the calculated probability and a parameter given in advance.</p> |
