发明名称 Temperature controller for plasma processing
摘要 The temperature of a substrate on the rotating table connected to the high voltage high frequency generator in a Plasma PVD or CVD reactor is measured by way of a tube, containing a inconel scaling tube with thermocouple. The signal of the thermocouple is transformed into optical signals. The optical signals are then transmitted to microprocessing means which generated signals representing the temperature of the substrate.
申请公布号 AU3547400(A) 申请公布日期 2000.11.02
申请号 AU20000035474 申请日期 2000.03.30
申请人 CHESSEN GROUP INC. 发明人 ANDREY GINOVKER;VLADIMIR CHEREPANOV
分类号 C23C14/54;H01J37/32;H01L21/00 主分类号 C23C14/54
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