发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device where a logic circuit and a storage circuit coexist, wherein in a power-on sequence, a gate control or internal node initialization is performed at a prestage of the storage circuit to prevent entrance of uncertain signal into the storage circuit. SOLUTION: A logic coexisting DRAM/LSI comprises a logic region 1, containing a logic circuit and a DRAM macro region 2 containing DRAM. The DRAM macro region 2 comprises an input latch circuit 21, which latches the output signal from an output latch circuit 12 of the logic region 1, a gate control circuit 22 comprising 2-input NOR gate, where that output signal is logically calculated with a reset signal for gate control, and then the output signal of fixed level is outputted, and a DRAM logic 23 which is controlled by a memory signal comprising the output signal, etc., and the input signal which is inputted in the DRAM logic 23 is set to a fixed level by the gate control circuit 22 during a power-source voltage step-up period at power on.
申请公布号 JP2000299436(A) 申请公布日期 2000.10.24
申请号 JP19990104774 申请日期 1999.04.13
申请人 HITACHI LTD;HITACHI ULSI SYSTEMS CO LTD 发明人 AKASAKI HIROSHI;YOKOYAMA YUJI;NAKAYAMA MICHIAKI;KATAYAMA MASAHIRO
分类号 G11C11/401;H01L21/822;H01L27/04;H01L27/10;H03K17/22;H03K19/0175;(IPC1-7):H01L27/04;H03K19/017 主分类号 G11C11/401
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