| 摘要 |
PROBLEM TO BE SOLVED: To provide a socket capable of prolonging the life by preventing solder attachment to a contact, and measuring a high frequency IC by reducing inductance of the contact and enhancing the alignment level of impedance. SOLUTION: A contact 13 mounted on an IC socket 10 is formed in a ball shape and is held by an elastic material 12 so that attachment of solder to a point of the contact 13 is prevented by rotating the contact 13 at a time of measurement. By forming the contact 13 with a ball itself, inductance decreases, and alignment of impedance is secured so that measurement of a high frequency IC is ensured.
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