Reduction of oxide stress through the use of forward biased body voltage

摘要

A method of reading a flash memory (EEPROM) device by applying zero to all bitlines except for the bitline to which the cell being read is attached, applying a positive voltage to the wordline to which the cell being read is attached and applying a positive voltage to the p-well in which the cell being read is formed. A positive voltage is applied to the bitline to which the cell being read is attached.