发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which the increase of terminals for inspection to inspect the operation of the integrated circuit is restricted. SOLUTION: When an SW signal is high level, an analog switch 4 is turned off, and an output signal (IN) from an output block 1 to an output drive circuit 2 and the operation of an output terminal are the same as in a conventional circuit. When the SW signal is low level, the output signal (IN) to the output drive circuit 2 is shut in the output drive circuit 2, and an output terminal of the output drive circuit 2 is turned to a high impedance. At the same time, the analog switch 4 is turned on, so that an internal signal S of the integrated circuit can be outputted to the output terminal. The internal signal of the integrated circuit can be monitored with the use of this terminal.
申请公布号 JP2000292496(A) 申请公布日期 2000.10.20
申请号 JP19990096171 申请日期 1999.04.02
申请人 FUJI ELECTRIC CO LTD 发明人 NAKAGOME KENJI
分类号 G01R31/28;H03K19/00;H03K19/0175;(IPC1-7):G01R31/28;H03K19/017 主分类号 G01R31/28
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