| 摘要 |
PROBLEM TO BE SOLVED: To analogically measure a transistor characteristic. SOLUTION: A test circuit has a first and a second 3st buffers TBI and TB2 connected to two points of an internal output terminal for switching a normal output mode and a test mode. At the first 3st buffer TB1 side, a first and a second transistors Tr1 and Tr2 which operate in the normal output mode are connected, and a first pad A disposed between the first transistor Tr1 and second transistor Tr2, a second pad B connected to the second 3st buffer TB2 side, a special power source V and a special ground G are provided. In the test mode, an optional voltage is impressed to the first and second pads A and B and a voltage of the special power source V is made an equal potential to a potential of the first pad A, and a current flowing in the first pad A is measured.
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