| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit which reduces the area of a pull-down element or pull-up element used to detect a fault of a semiconductor integrated circuit including a tristate element. SOLUTION: To a bus signal line 307 to which multiple tristate elements are connected, a current mirror circuit composed of nMOS transistor(TR) 321 and 322 is connected and to the current mirror circuit, a pMOS TR 323 is connected in series. The current flowing to the nMOS TR 321 is equal to the current flowing to the nMOS TR 322 and pMOS TR 323. Using the ON resistance of the nMOS TR 321 reduces the current flowing to the nMOS TR 321, so a pull-down element with low driving capability can be formed without wasting the area.
|
