发明名称 X-RAY INSPECTION DEVICE
摘要 PROBLEM TO BE SOLVED: To improve inspection performance, by preventing the occurrence of a region receiving no X-ray scanning in a test object, even if a conveyance speed of the test object is increased. SOLUTION: An X-ray is irradiated to a test object 2 conveyed on a belt conveyor 3, and a transmission dose thereof is inputted into arrayed X-ray sensors 4, and as for an inputted measurement content, measurement contents lined up in series of first-row arrayed X-ray sensors are divided by an MPX circuit 5 into plural four blocks in the direction rectangular to the conveyance direction. Memory contents in sensors are read out in parallel from a first channel of divided blocks, and A/D conversion of read-out signals are executed respectively by an A/D converter 6, and respective results are memorized temporarily in a buffer memory having sixty-four addresses, and the content is synthesized with data in the first-row arrayed X-ray sensors in the direction rectangular to the conveyance direction of the belt conveyor 3 by a parallel/serial converter 8, and image processing thereof is executed by an image processing device 6, and the result is written in a frame memory 9 and displayed on a display 12.
申请公布号 JP2000292371(A) 申请公布日期 2000.10.20
申请号 JP19990100516 申请日期 1999.04.07
申请人 HITACHI MEDICAL CORP 发明人 IKETANI KAZUYUKI;HIGUCHI KAZUHIRO
分类号 G01N23/04;(IPC1-7):G01N23/04 主分类号 G01N23/04
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