发明名称 METHOD AND APPARATUS FOR GENERATING AND CONFINING A REACTIVE GAS FOR ETCHING SUBSTRATES
摘要 A method for performing localized etching reactions on a substrate by confining a reactive gas with a non-reactive gas curtain is described. In the method, a reactive gas capable of etching the etchable substrate is generated. The reactive gas is applied to the etchable substrate. A non-reactive gas is flowed towards the substrate in the form of a non-reactive gas curtain around the reactive gas so as to substantially confine the reactive gas to a predetermined etching region on the substrate. An apparatus for carrying out the above described method is also disclosed.
申请公布号 WO0042632(B1) 申请公布日期 2000.10.19
申请号 WO2000US00744 申请日期 2000.01.12
申请人 IPEC PRECISION, INC. 发明人 AMERICA, WILLIAM, G.;GRATRIX, EDWARD, J.;ROBBINS, MICHAEL, D.
分类号 H01J37/32;(IPC1-7):H01J37/32 主分类号 H01J37/32
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