发明名称 |
METHOD AND APPARATUS FOR GENERATING AND CONFINING A REACTIVE GAS FOR ETCHING SUBSTRATES |
摘要 |
A method for performing localized etching reactions on a substrate by confining a reactive gas with a non-reactive gas curtain is described. In the method, a reactive gas capable of etching the etchable substrate is generated. The reactive gas is applied to the etchable substrate. A non-reactive gas is flowed towards the substrate in the form of a non-reactive gas curtain around the reactive gas so as to substantially confine the reactive gas to a predetermined etching region on the substrate. An apparatus for carrying out the above described method is also disclosed.
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申请公布号 |
WO0042632(B1) |
申请公布日期 |
2000.10.19 |
申请号 |
WO2000US00744 |
申请日期 |
2000.01.12 |
申请人 |
IPEC PRECISION, INC. |
发明人 |
AMERICA, WILLIAM, G.;GRATRIX, EDWARD, J.;ROBBINS, MICHAEL, D. |
分类号 |
H01J37/32;(IPC1-7):H01J37/32 |
主分类号 |
H01J37/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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