摘要 |
A wiring board for electrical tests; having an insulating substrate, wiring of predetermined pattern which is embedded in the insulating substrate, and bump electrodes which are formed on the wiring and which are respectively brought into contact with corresponding electrodes of an article to-be-tested. Thus, even when the electrode pitch of the article to-be-tested such as a semiconductor device has become smaller(for example, less than 0.1 [mm]), the electrodes can be formed so as to cope with the electrical tests of the article.
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申请人 |
HITACHI CHEMICAL COMPANY, LTD. |
发明人 |
FUKUTOMI, NAOKI;NAKAMURA, HIDEHIRO;NAKAYAMA, HAJIME;TSUBOMATSU, YOSHIAKI;NAKAMURA, MASANORI;KAITOU, KOUICHI;KUWANO, ATSUSHI;WATANABE, ITSUO;ITABASHI, MASAHIKO |