Imaging base with backside roughness at two frequencies

摘要

The invention relates to imaging elements comprising a back surface wherein said back surface has a low frequency roughness component having a roughness average of between 0.30 and 2.00 mu m when measured with a low pass cutoff filter of 500 cycles/mm and a high frequency component having a roughness average of 0.001 to 0.05 mu m when measured with a high pass cutoff filter of 500 cycles/mm.