发明名称 Device for the measurement of heat transfer characteristics of multilayer sample arrangements
摘要 The invention provides a device for measuring heat transfer through plate-like sample arrangements under various test conditions. The device consists of two chambers. For determining the heat transfer through the sample arrangement located between the two chambers the first chamber is set at a certain temperature or undergoes a temperature variation. Furthermore, the sample arrangement can be exposed to heat radiation provided by a surface heater in front of the sample arrangement as well as to convective heat realized by using an ventilation system. Temperature changes as a result of heat transfer through the test samples are measured within the second chamber using PT 100 temperature sensors. Furthermore, temperature measurements are taken at locations inside the sample arrangement. Infrared sensors are used to measure the irradiation intensity in front of the sample arrangement and the heat emission from the back side of the sample arrangement. Thermophysical characteristics such as thermal conductivity, thermal resistance, heat absorption, heat transition and heat emission of multilayered insulation products are determined under the various test conditions from the measured temperatures, heat fluxes as well as the thickness of the sample arrangement.
申请公布号 US6132082(A) 申请公布日期 2000.10.17
申请号 US19970986656 申请日期 1997.12.08
申请人 PAUSE, BARBARA HILDEGARD 发明人 PAUSE, BARBARA HILDEGARD
分类号 G01K17/20;(IPC1-7):G01N25/20;G01N25/18 主分类号 G01K17/20
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