Method and apparatus for slanted attitude testing and/or for co-planarity testing of a contact for SMD components

摘要

An entire contact row of an SMD component is illuminated by a light source direction in the direction of the contact row, and a shadow of the entire contact row is directed by a linear sensor. A shift of the contact row perpendicular to a contact surface formed by the contact row effects a shift of the position of the shadow on the linear sensor and also effects a modification of the expanse of the shadow. By identifying the minimum expanse of the shadow, a criterion for the co-planarity of the contact row derives from the minimum expanse itself and an indicator about the slanting attitude of the component derives from the position having the minimum expanse.