| 摘要 |
PURPOSE: A connector for a semiconductor element test is provided to minimize an area occupied due to installation of a connector and further minimize influence of noise during to a high frequency test of the element. CONSTITUTION: A plurality of through holes(15) are formed on a housing(14) to face each other. Contact pins(16) are inserted into insides of the through holes, contacted to a lead(3a) of an element at one end thereof and contacted with a pattern of a substrate at other end thereof. An elastic member(18) is installed on a lower part of the contact pins(16) to recover the contact pins when an external force applied to the contact pins is removed. The elastic member(18) which is installed within the housing(14) and recovers the contact pins when the external force applied to the contact pins(16) is removed is inserted into an inside of an inserting groove(19). The inserting groove(19) is formed in a length direction perpendicular to the through holes(15). The elastic member(18) is made of a silicon rubber which has a relatively good elasticity.
|
