发明名称 Semiconductor memory device and a method for fabricating the same
摘要 A semiconductor memory device and a method of fabricating the same are provided, in which an interlayer film which only covers a peripheral circuit region except a memory cell array region is formed above the peripheral circuit region to reduce a topological difference between both regions after bitlines are formed, therefore a semiconductor substrate which has a plain surface as a main one can be used as a starting body with no preliminary processing thereon and a shallow trench isolation technique can also be applied, besides interconnects to the peripheral circuit can be led up to the surface of the device through a multi-step plug connection and thereby processing of large aspect-ratio holes, stuffing of metal in the holes and the like are unnecessary and as a result reliability of the process is improved.
申请公布号 US6130449(A) 申请公布日期 2000.10.10
申请号 US19970943592 申请日期 1997.10.03
申请人 HITACHI, LTD. 发明人 MATSUOKA, HIDEYUKI;KIMURA, SHINICHIRO;YAMANAKA, TOSHIAKI
分类号 H01L21/02;H01L21/8242;H01L27/108;H01L29/92;(IPC1-7):H01L27/108;H01L29/76;H01L29/94;H01L31/119;H01L29/40 主分类号 H01L21/02
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