发明名称 SEMICONDUCTOR WAFER CLEANING DEVICE
摘要 PROBLEM TO BE SOLVED: To protect a semiconductor wafer itself or wirings or the like formed on the wafer against damage caused by static electricity, by a method where static electricity induced when contaminants attached to the surface of a semi conductor wafer as a work are removed by spouting out liquid droplets against the wafer is grounded. SOLUTION: Droplets 5 are sprayed on the surface of a semiconductor wafer 7 as a work to remove contaminants attached to the wafer 7. In this case, rinsing pure water 9 where carbon dioxide gas is dissolved is sprayed on the rear surface of the wafer 7, by which a current flowing from the charged droplets 5 to the wafer 7 is grounded outside through the rinsing pure water 9.
申请公布号 JP2000277476(A) 申请公布日期 2000.10.06
申请号 JP19990079291 申请日期 1999.03.24
申请人 SHIMADA PHYS & CHEM IND CO LTD 发明人 KITAGAWA KENICHI
分类号 B08B3/08;B08B3/10;H01L21/304;(IPC1-7):H01L21/304 主分类号 B08B3/08
代理机构 代理人
主权项
地址