发明名称 ELECTRODE PATTERN INSPECTING DEVICE AND ELECTRODE PATTERN INSPECTING METHOD
摘要 PROBLEM TO BE SOLVED: To reliably inspect a stripe-like electrode pattern connected with one end to a common electrode without being affected by the position precision of the electrode pattern. SOLUTION: In this electrode pattern inspecting method, a constant DC current is applied to one end of a transparent electrode 21a by a constant current applying terminal 2, a voltage is measured from one end of an adjacent transparent electrode 21b by a voltage detecting terminal 4, and a common electrode 22 near the transparent electrodes 21a, 21b is grounded by a brush-like earth terminal 3. When a wire severance occurs on the transparent electrode 21a, a constant DC current applying circuit 5 detects a voltage saturation state. When a short circuit occurs, a DC voltage detecting circuit 6 detects a voltage change. A short circuit/wire severance memory circuit 7 stores the detected voltage change as defect information and detects the wire severance or short circuit based on this defect information.
申请公布号 JP2000275295(A) 申请公布日期 2000.10.06
申请号 JP20000004038 申请日期 2000.01.12
申请人 SHARP CORP 发明人 TAKASHIMA NAOKI;KAGEYAMA TETSUYA
分类号 G01R31/02;G01R31/28;G02F1/1343;(IPC1-7):G01R31/02 主分类号 G01R31/02
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