发明名称 Memory cell structure, especially for a DRAM, has a contact within a substrate for connecting a capacitor and a MOS transistor on opposite substrate surfaces
摘要 A memory cell structure comprises a contact (K) within a substrate (S) for connecting a capacitor and a MOS transistor on opposite substrate surfaces (O1, O2). A memory cell structure comprises a MOS transistor connected to a bit line (B) on one substrate surface (O1), a capacitor on the opposite substrate surface (O2) and a contact (K) in the substrate (S) for connecting the capacitor with the MOS transistor. An Independent claim is also included for production of the above memory cell structure.
申请公布号 DE19914496(A1) 申请公布日期 2000.10.05
申请号 DE19991014496 申请日期 1999.03.30
申请人 SIEMENS AG 发明人 WILLER, JOSEF;REISINGER, HANS;SCHLOESSER, TILL;STENGL, REINHARD
分类号 H01L21/8242;H01L21/8246;H01L27/105;H01L27/108;(IPC1-7):H01L27/108;H01L21/824 主分类号 H01L21/8242
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