发明名称 |
Memory cell structure, especially for a DRAM, has a contact within a substrate for connecting a capacitor and a MOS transistor on opposite substrate surfaces |
摘要 |
A memory cell structure comprises a contact (K) within a substrate (S) for connecting a capacitor and a MOS transistor on opposite substrate surfaces (O1, O2). A memory cell structure comprises a MOS transistor connected to a bit line (B) on one substrate surface (O1), a capacitor on the opposite substrate surface (O2) and a contact (K) in the substrate (S) for connecting the capacitor with the MOS transistor. An Independent claim is also included for production of the above memory cell structure.
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申请公布号 |
DE19914496(A1) |
申请公布日期 |
2000.10.05 |
申请号 |
DE19991014496 |
申请日期 |
1999.03.30 |
申请人 |
SIEMENS AG |
发明人 |
WILLER, JOSEF;REISINGER, HANS;SCHLOESSER, TILL;STENGL, REINHARD |
分类号 |
H01L21/8242;H01L21/8246;H01L27/105;H01L27/108;(IPC1-7):H01L27/108;H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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