发明名称 |
METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE AND CAPACITOR FABRICATED THEREBY |
摘要 |
PURPOSE: A method for fabricating a capacitor of a semiconductor device and a capacitor fabricated thereby is provided to fabricate a capacitor having excellent electric properties by preventing a storage electrode and a recessed plug below the electrode. CONSTITUTION: Holes are formed in an interlayer insulating film(34) to expose a semiconductor substrate(21). Recessed plugs(37) are formed within the holes. The upper surface of the recessed plug(37) is lower than the surface of the interlayer insulating film(34). A seed layer pattern(39) is formed along the bottom and a side wall of a groove part which is formed by the recessed plug(37) and the interlayer insulating film(34). A storage electrode(45) is arranged on the seed layer pattern(39). Undercut areas between the periphery of the storage electrode(45) and the interlayer insulating film(34) are filled with a dielectric film(47) having high dielectric constant and a plate electrode(49).
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申请公布号 |
KR20000059695(A) |
申请公布日期 |
2000.10.05 |
申请号 |
KR19990007502 |
申请日期 |
1999.03.08 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
LEE, BYEONG TAEK |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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