发明名称 PLASMA SURFACE PROCESSOR FOR SEMICONDUCTOR SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To avoid the facilities from becoming enormous, when a plurality of types of surface processes are effected by a plasma surface processor, in which a semiconductor substrate such as a silicon wafer, etc., fed into a core chamber is mounted in the surface processor of a plasma processing unit connected to this core chamber via a gate value, and the surface processing is effected by plasma therein. SOLUTION: In a condition that supplies a control means 12 of a processing gas for a plasma surface processing unit is fitted on a plasma surface processing unit 2, the plasma surface processing unit 2 is structured so as to be separated from a core chamber 1, and by an exchange of the plasma surface processing unit, it is possible to effect a plurality of types of surface processes by use of the one core chamber 1.
申请公布号 JP2000269149(A) 申请公布日期 2000.09.29
申请号 JP19990076392 申请日期 1999.03.19
申请人 ROHM CO LTD 发明人 TANAKA KENJI;UEMOTO YOSHINORI
分类号 H01L21/302;C23C14/56;H01L21/205;H01L21/3065;H05H1/46 主分类号 H01L21/302
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