发明名称 Method and apparatus for adaptively learning test error sources to reduce the total number of test measurements required in real-time
摘要 <p>A method and system for optimizing the number of required measurements to obtain in real-time by an automated tester (10) that tests a device under test (108) is presented. At the beginning of a run of the test, each measurement required to calculate the component value is measured in real-time (42) and then maintained as a historical measurement (34). On each subsequent iteration, the test attempts to remeasure the fewest number of measurements in real-time that, when calculations are performed using the real-time measurements (42) and substituting historical measurements (34) for those required measurements that were not taken in real-time, results in an accurate reflection of whether the device being tested (108) passes or fails. If the test fails, a potential false failure condition is detected. Via additional processing (26), it is then determined what other measurements must be taken in real-time to compensate for the error source that may have caused the potential false failure. A measurement combination processor (30) selects a set of retry measurements (36) to be taken in real-time, and the calculations are repeated using the retry measurements until the device under test (108) either passes, or is determined to be a true failure. <IMAGE></p>
申请公布号 EP1039389(A1) 申请公布日期 2000.09.27
申请号 EP20000301326 申请日期 2000.02.21
申请人 AGILENT TECHNOLOGIES INC 发明人 CROOK, DAVID T.;LIST, STEVEN K.;ROZUM, STEPHEN P.;WILLIAMSON, EDDIE L.
分类号 G01R27/02;G01R31/00;G01R31/28;G06F11/22;(IPC1-7):G06F11/22 主分类号 G01R27/02
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