发明名称 |
Contour replicating and measuring device |
摘要 |
A surface replicating and contour measuring device substantially comprises a mechanical pin array having calibration pins mounted on a frame, an imaging system for recording contour and a data processor for storing and manipulating the recorded information.
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申请公布号 |
US6125338(A) |
申请公布日期 |
2000.09.26 |
申请号 |
US19980064466 |
申请日期 |
1998.04.22 |
申请人 |
UNIVERSITY OF PITTSBURGH |
发明人 |
BRIENZA, DAVID M.;BRIENZA, MICHAEL J. |
分类号 |
G01B5/207;(IPC1-7):G01B5/20 |
主分类号 |
G01B5/207 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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